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dc.contributor.authorAlbert E
dc.contributor.authorAbdellah A
dc.contributor.authorScarpa G
dc.contributor.authorLugli P
dc.contributor.editorIEEE
dc.date.accessioned2019-04-29T11:30:41Z
dc.date.available2019-04-29T11:30:41Z
dc.date.issued2012
dc.identifier.isbn978-1-4673-2198-3
dc.identifier.issn1944-9399
dc.identifier.urihttp://dx.doi.org/10.1109/NANO.2012.6321992
dc.identifier.urihttp://ieeexplore.ieee.org/document/6321992/?arnumber=6321992
dc.identifier.urihttp://hdl.handle.net/10863/9599
dc.description.abstractA Monte Carlo based computational model was developed to analyze the electrical transport properties in networks of randomly arranged single wall carbon nanotubes. The CNTs are modeled as stiff sticks with a lognormal distributed length. The average stick length and diameter size are deduced from a CNT film fabricated with the spray deposition technique. Intertube junctions as well as single tubes are represented by resistances. The analyzed networks are composed of both metallic and semiconducting CNTs in a ratio of 1/3. The electrical properties are obtained with the circuit analysis and simulation tool HSPICE. The measured sheet resistances and conductivities were compared with the simulation results. The validity of the model is confirmed by the good match between the simulation and experimentally obtained results. © 2012 IEEE.en_US
dc.languageEnglish
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation12th IEEE International Conference on Nanotechnology (NANO 2012) ; Birmingham : 20.8.2012 - 23.8.2012
dc.rights
dc.subjectHSPICEen_US
dc.subjectNanotube networken_US
dc.subjectCarbon nanotubes (CNT)en_US
dc.subjectSpray depositionen_US
dc.titleElectronic transport modeling with HSPICE in random CNT networksen_US
dc.typeBook chapteren_US
dc.date.updated2019-04-28T03:00:35Z
dc.publication.title2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO 2012): Birmingham, United Kingdom, 20 - 23 August 2012
dc.language.isiEN-GB
dc.journal.titleProceedings of the ... IEEE Conference on Nanotechnology
dc.description.fulltextreserveden_US


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