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dc.contributor.authorFasol G
dc.contributor.authorFasolino A
dc.contributor.authorLugli P
dc.contributor.editor
dc.date.accessioned2018-02-23T16:20:44Z
dc.date.available2018-02-23T16:20:44Z
dc.date.issued1989
dc.identifier.isbn978-1-4757-6567-0
dc.identifier.issn0258-1221
dc.identifier.urihttp://dx.doi.org/10.1007/978-1-4757-6565-6
dc.identifier.urihttp://link.springer.com/book/10.1007/978-1-4757-6565-6
dc.identifier.urihttp://hdl.handle.net/10863/4359
dc.language.isoenen_US
dc.publisherSpringer USen_US
dc.relation.ispartofseriesNATO Advanced Science Institutes Series B: Physics;
dc.rights
dc.subjectAbsorptionen_US
dc.subjectDispersionen_US
dc.subjectEnergieen_US
dc.subjectExcitonen_US
dc.subjectNonlinear opticsen_US
dc.subjectOptical propertiesen_US
dc.subjectOpticsen_US
dc.subjectSemiconductoren_US
dc.subjectSimulationen_US
dc.subjectSpectroscopyen_US
dc.titleSpectroscopy of semiconductor microstructuresen_US
dc.typeBooken_US
dc.date.updated2017-09-25T07:45:55Z
dc.publication.titleSpectroscopy of Semiconductor Microstructures
dc.language.isiEN-GB
dc.description.fulltextreserveden_US


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