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    Experimental and Monte Carlo analysis of near-breakdown phenomena in GaAs-based heterostructure FETs 

    Sleiman A; Di Carlo A; Tocca L; Lugli P; Zandler G; Meneghesso G; Zanoni E; Canali C; Cetronio A; Lanzieri M; Peroni M (IOP PUBLISHING LTD, 2001)
    We present experimental end theoretical data related to the impact ionization in the near-breakdown regime of AlGaAs/InGaAs pseudomorphic high-electron-mobility transistors (P-HEMTs) and AlGaAs/GaAs heterostructure field ...

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AuthorCanali C (1)
Cetronio A (1)
Di Carlo A (1)
Lanzieri M (1)Lugli P (1)Meneghesso G (1)Peroni M (1)Sleiman A (1)Tocca L (1)Zandler G (1)... View MoreDate Issued2001 (1)Full Text Availability
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