Search
Now showing items 1-1 of 1
-
Experimental and Monte Carlo analysis of near-breakdown phenomena in GaAs-based heterostructure FETs
(IOP PUBLISHING LTD, 2001)We present experimental end theoretical data related to the impact ionization in the near-breakdown regime of AlGaAs/InGaAs pseudomorphic high-electron-mobility transistors (P-HEMTs) and AlGaAs/GaAs heterostructure field ...