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X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films
Journal article

X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films

JS Kim, PKH Ho, DS Thomas, RH Friend, Franco Cacialli, GW Bao and SFY Li
Chemical Physics Letters, Vol.315(5-6), pp.307-312
315
31/12/1999
Handle:
https://hdl.handle.net/10863/26320

Abstract

url
https://www.sciencedirect.com/science/article/pii/S0009261499012336?via%3DihubView

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