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Patterning Poly (3-Hexylthiophene) in the Sub-50-nm Region by Nanoimprint Lithography
Journal article   Peer reviewed

Patterning Poly (3-Hexylthiophene) in the Sub-50-nm Region by Nanoimprint Lithography

G Scarpa, A Abdellah, A Exner, S Harrer, GP Blanco, W Wiedemann, L Schmidt-Mende and Paolo Lugli
IEEE Transactions on Nanotechnology, Vol.10(3), pp.482-488
10
01/05/2011
Handle:
https://hdl.handle.net/10863/3857

Abstract

Poly(3-hexylthiophene-2,5-diyl) Organic photovoltaic devices (OPVs) Nanostructuring Nanoimprint lithography (NIL) Organic semiconductors Sensors
url
http://ieeexplore.ieee.org/abstract/document/5451089/View

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