Abstract
Intelligent detection of product surface defects in the industrial scene is the key to ensuring product quality. On general benchmarks, current unsupervised anomaly detection techniques have achieved significant success. When used in complex industrial environments (e.g., large industrial components with small defects), the model needs to be able to adapt to different imaging scenarios (e.g., illumination and resolution) and accurately detect and localize anomalies, but its performance is still far from satisfactory. Besides, the complex and unstable optical lighting environment for collecting such data poses major challenges in establishing unified benchmarks for optical lighting and imaging resolution in defect detection. To fill this gap, we build a standard imaging system-based multiscene unsupervised anomaly detection dataset, coined as MSC-AD. In particular, it provides 12 imaging scenes, i.e., a cross combination of low-to-high three illuminations and 150 × 150 to 600 × 600 four resolutions, in which six types of large casting surfaces with different structures include five kinds of small defects with sample-level and pixel-level precise ground truth. We systematically investigate representative baseline methods and empirical analysis on this dataset to obtain a number of interesting findings, e.g., how to detach from distinctly different imaging scenes, and how to distinguish between subtly normal–anomaly classes. To the best of our knowledge, MSC-AD is the first multi-illumination, multiresolution, multisurface, and multidefect dataset built in a standard imaging system.