Abstract
Low-frequency resistance fluctuations were measured on-polypyrrole thin-film resistors. The samples were obtained by chemical-vapor deposition onto copper chloride patterned precursors. The measurements were devoted to characterize the noise spectral density of constant-current-biased samples. The dependence of the noise magnitude on the applied de voltage was studied revealing that the noise cannot be ascribed only to equilibrium resistance fluctuations. Application of the Hooge formula provided an estimate of carrier density in the material.