Grazing incidence small angle X-ray scattering study of defects in deuterium implanted monocrystalline silicon

Journal article

Peer reviewed

P Dubcek, B Pivac, S Berntorff, Federico Corni, R Tonini and G Ottaviani

Journal of Applied Crystallography, Vol.36, pp.447-449

36

2003

Handle:

https://hdl.handle.net/10863/40227

Details

Title: Grazing incidence small angle X-ray scattering study of defects in deuterium implanted monocrystalline silicon
Creators: P Dubcek
B Pivac
S Berntorff
Federico Corni
R Tonini
G Ottaviani
Publication Details: Journal of Applied Crystallography, Vol.36, pp.447-449
ISSN: 0021-8898
EISSN: 1600-5767
Series / Volume: 36
Publisher: International Union of Crystallography
Identifiers: (UNIBZ)29218938
991006737296001241
Scopus ID: 2-s2.0-0037702779
Academic Unit: Faculty of Education
Language: English
Resource Type: Journal article
Author Names String: Dubcek P, Pivac B, Berntorff S, Corni F, Tonini R, Ottaviani G
Additional Description: description: Record is part of a bulk validation set

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