Logo image
Evidence for H-2 at high pressure in the silicon nanocavities after dipping in HF solution
Journal article   Peer reviewed

Evidence for H-2 at high pressure in the silicon nanocavities after dipping in HF solution

E Romano, GF Cerofolini, D Narducci, Federico Corni, S Frabboni, G Ottaviani and R Tonini
Surface Science, Vol.603(14), pp.2188-2192
603
2009
Handle:
https://hdl.handle.net/10863/41850

Abstract

Details

Metrics

1 Record Views