Abstract
Samples of single-walled carbon nanotubes (SWCNTs) organized in the form of thin membranes have been investigated in order to correlate the mechanical deformation and conductivity behavior of such nanosized material. The nanotubes gauge factor of piezoresistivity has been evaluated by comparing the electrical responses induced by the deformation in SWCNT membranes and in Si substrates with the same electrical characteristics. The gauge factor of the SWCNT-Si systems was found to be a factor 2.3-2.5 larger than that of the Si substrates. We have also observed that temperature slightly enhances the piezoresistive response of the SWCNT. (C) 2004 American Institute of Physics.