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Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography
Journal article   Peer reviewed

Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography

M. van Dael, P. Verboven, Angelo Zanella, J. Sijbers and B. Nicolai
Postharvest Biology and Technology, Vol.148(2), pp.218-227
2018
Handle:
https://hdl.handle.net/10863/32415

Abstract

Biology Therapy Education Pharmacology Physics
url
https://www.sciencedirect.com/science/article/pii/S0925521418300565View

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