A study of the ITO-on-PPV interface using photoelectron spectroscopy

N Johansson; Franco Cacialli; KZ Xing; G Beamson; DT Clark; RH Friend; WR Salaneck

doi:10.1016/S0379-6779(98)80088-X

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Journal article

A study of the ITO-on-PPV interface using photoelectron spectroscopy

N Johansson, Franco Cacialli, KZ Xing, G Beamson, DT Clark, RH Friend and WR Salaneck

SYNTHETIC METALS, Vol.92(3), pp.207-211

15/02/1998

DOI: https://doi.org/10.1016/S0379-6779(98)80088-X

Handle:

https://hdl.handle.net/10863/26665

Abstract

poly(p-phenylene vinylene)

photoelectron spectroscopy

Interfaces

Angle-dependent photoelectron spectroscopy has been used to study some details of the chemistry at the interface between indium-tin-oxide, deposited by argon plasma sputtering, and poly(p-phenylene vinylene). We find chemical species corresponding to different oxidized states of poly(p-phenylene vinylene) and we discuss their assignment with reference to those produced in photo-oxidation experiments. (C) 1998 Elsevier Science S.A.

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Details

Title: A study of the ITO-on-PPV interface using photoelectron spectroscopy
Creators: N Johansson
Franco Cacialli
KZ Xing
G Beamson
DT Clark
RH Friend
WR Salaneck
Publication Details: SYNTHETIC METALS, Vol.92(3), pp.207-211
ISSN: 0379-6779
Series / Volume: 92
Publisher: ELSEVIER SCIENCE SA
Number of pages: 5
Identifiers: (UNIBZ)66050609
991006465097301241
Web of Science ID: 000072276400003
Scopus ID: 2-s2.0-0032000659
Academic Unit: Faculty of Science and Technology
Language: English
Resource Type: Journal article
Author Names String: Johansson N, Cacialli F, Xing KZ, Beamson G, Clark DT, Friend RH, Salaneck WR

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