Using variable threshold displacement energy for degradation fitting of particle irradiated multi-junction space solar cells

M Salzberger; C Nomayr; M Rutzinger; Paolo Lugli; CG Zimmermann

doi:10.1109/PVSC.2016.7750299

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Using variable threshold displacement energy for degradation fitting of particle irradiated multi-junction space solar cells

Conference proceeding

Peer reviewed

Using variable threshold displacement energy for degradation fitting of particle irradiated multi-junction space solar cells

M Salzberger, C Nomayr, M Rutzinger, Paolo Lugli and CG Zimmermann

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC): 5-10 June 2016, pp.3405-3410

43rd Photovoltaic Specialists Conference (PVSC 2016) (Portland, Or, 05/06/2016 - 10/06/2016)

2016

DOI: https://doi.org/10.1109/PVSC.2016.7750299

Handle:

https://hdl.handle.net/10863/2518

Abstract

Sensors

The degradation of Ga0.5In0.5P/GaAs/Ge triple junction 3G28, 3G30 and isotype 3G28 Ga0.5In0.5P and GaAs cells is analysed and the characteristic degradation curves are determined. The well established displacement damage method was applied in combination with a variable Td as a fitting parameter. The validity of the NIEL data analysis was verified by the reproduction of a Td of 21 eV for GaAs. The same method that has been published recently yields 36 eV for Ga0.5In0.5P single junction cells. The analytically calculated NIEL for GaAs and Ga0.5In0.5P with these respective threshold displacement energies overlap, which is the reason why both NIELs can be used for degradation fitting of the triple junction cell.

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Details

Title: Using variable threshold displacement energy for degradation fitting of particle irradiated multi-junction space solar cells
Creators: M Salzberger
C Nomayr
M Rutzinger
Paolo Lugli
CG Zimmermann
Publication Details: 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC): 5-10 June 2016, pp.3405-3410
Editor(s): IEEE
ISBN: 978-1-5090-2725-5
EISBN: 978-1-5090-2724-8
Conference: 43rd Photovoltaic Specialists Conference (PVSC 2016) (Portland, Or, 05/06/2016 - 10/06/2016)
Publisher: IEEE
Piscataway, NJ
Identifiers: 978-1-5090-2725-5
(UNIBZ)22699712
991005773543201241
Web of Science ID: 000399818703092
Scopus ID: 2-s2.0-85003571515
Academic Unit: Faculty of Science and Technology
Language: English
Resource Type: Conference proceeding
Author Names String: Salzberger M, Nomayr C, Rutzinger M, Lugli P, Zimmermann CG
Additional Description: srcEditors: IEEE

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