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Transport Characterization of a Gated Molecular Device with Negative Differential Resistance
Conference proceeding   Peer reviewed

Transport Characterization of a Gated Molecular Device with Negative Differential Resistance

A Mahmoud and Paolo Lugli
2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO 2012): Birmingham, United Kingdom, 20 - 23 August 2012, Vol.12
12
12th IEEE International Conference on Nanotechnology (NANO 2012) (Birmingham, 20/08/2012 - 23/08/2012)
01/01/2012
Handle:
https://hdl.handle.net/10863/3905

Abstract

Negative differential resistance NEGF Molecular devices Oligo(phenylene vinylene) Sensors
url
http://ieeexplore.ieee.org/abstract/document/6321941/View

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