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Towards an ontology pattern language for harmonizing software process related ISO standards
Conference proceeding   Peer reviewed

Towards an ontology pattern language for harmonizing software process related ISO standards

FB Ruy, R Almeida Falbo, MP Barcellos and Giancarlo Guizzardi
SAC '15: Proceedings of the 30th Annual ACM Symposium on Applied Computing, pp.388-395
30th ACM Symposium on Applied Computting (ACM SAC 2015) (Salamanca, 13/04/2015 - 17/04/2015)
2015
Handle:
https://hdl.handle.net/10863/16497

Abstract

url
https://dl.acm.org/doi/abs/10.1145/2695664.2695796View

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