Series resistance mapping of III-V multijunction solar cells based on luminescence imaging

H Nesswetter; W Dyck; Paolo Lugli; A Bett; C Zimmermann

doi:10.1109/PVSC.2013.6744103

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Series resistance mapping of III-V multijunction solar cells based on luminescence imaging

Conference proceeding

Peer reviewed

Series resistance mapping of III-V multijunction solar cells based on luminescence imaging

H Nesswetter, W Dyck, Paolo Lugli, A Bett and C Zimmermann

2013 IEEE 39th Photovoltaic Specialists Conference: (PVSC 2013); Tampa, Florida, USA, 16 - 21 June 2013, pp.76-80

Conference record of the Photovoltaics Conference

39th Photovoltaic Specialists Conference (PVSC 2013) (Tampa, FL, 16/06/2013 - 21/06/2013)

2013

DOI: https://doi.org/10.1109/PVSC.2013.6744103

Handle:

https://hdl.handle.net/10863/9539

Abstract

Multijunction photovoltaic cells

Series resistance

Electroluminescence (EL)

Photoluminescence

Sensors

A method for spatially resolved series resistance measurements of Ga InP/Ga(In)As/Ge triple-junction solar cells based on electro- and photoluminescence imaging is presented. The results gained from luminescence images of all three subcells clearly indicate the main contributions to the series resistance like interrupted gridfingers, the frontside metallization itself and the top cell emitter layer. Test cells with partially electron irradiated areas are used to demonstrate that the method is not sensitive to inhomogeneous dark I-V parameters. © 2013 IEEE.

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Title: Series resistance mapping of III-V multijunction solar cells based on luminescence imaging
Creators: H Nesswetter
W Dyck
Paolo Lugli
A Bett
C Zimmermann
Publication Details: 2013 IEEE 39th Photovoltaic Specialists Conference: (PVSC 2013); Tampa, Florida, USA, 16 - 21 June 2013, pp.76-80
Editor(s): IEEE
ISBN: 978-1-4799-3300-6
EISBN: 978-1-4799-3299-3
ISSN: 0160-8371
Conference: 39th Photovoltaic Specialists Conference (PVSC 2013) (Tampa, FL, 16/06/2013 - 21/06/2013)
Series / Volume: Conference record of the Photovoltaics Conference
Publisher: Institute of Electrical and Electronics Engineers Inc.
Piscataway, NJ
Identifiers: 978-1-4799-3300-6
(UNIBZ)22600434
991005773217001241
Scopus ID: 2-s2.0-84896476951
Academic Unit: Faculty of Science and Technology
Language: English
Resource Type: Conference proceeding
Author Names String: Nesswetter H, Dyck W, Lugli P, Bett A, Zimmermann C
Additional Description: srcEditors: IEEE

Series resistance mapping of III-V multijunction solar cells based on luminescence imaging

Abstract

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