Logo image
Back
Monte-Carlo Simulation as a Novel Technique in the Study of Shallow Centers
Conference proceeding   Peer reviewed

Monte-Carlo Simulation as a Novel Technique in the Study of Shallow Centers

L Reggiani, Paolo Lugli and V Mitin
Shallow impurities in semiconductors 1988: proceedings of the Third International Conference held in Linköping, Sweden, 10-12 August 1988, Vol.95, pp.545-550
Conference Series- Institute of Physics, 95
3rd International conference on Shallow Impurities in Semiconductors (Linköping, 10/08/1988 - 12/08/1988)
1989
Handle:
https://hdl.handle.net/10863/4313

Abstract

Sensors
We present the Monte Carlo technique as a novel numerical method to investigate recombination and generation processes from shallow impurity centers. In particular, we provide a first-principle derivation of the microscopic and macroscopic capture cross-section due to acoustic phonon processes which compares favorably with experimental results.

Details

Metrics

32 Record Views