Can cellular automata methods compete with Monte Carlo semiconductor device simulations?

G Zandler; A Rein; M Saraniti; P Vogl; Paolo Lugli

Back

Can cellular automata methods compete with Monte Carlo semiconductor device simulations?

Conference proceeding

Peer reviewed

Can cellular automata methods compete with Monte Carlo semiconductor device simulations?

G Zandler, A Rein, M Saraniti, P Vogl and Paolo Lugli

Proceedings of the 23rd European Solid State Device Research Conference: Grenoble, France, 13 - 16 September 1993, pp.21-28

23rd European Solid State Device Research Conference, ESSDERC 1993 (Grenoble, 13/09/1993 - 16/09/1993)

1993

Handle:

https://hdl.handle.net/10863/4338

Abstract

Sensors

A cellular-automaton (CA) approach for solving the Boltzmann equation is presented and applied to semiconductor device simulation. The comparison with Drift Diffusion and Monte Carlo (MC) algorithms shows the capabilities of the CA as a modelling tool, even in the presence of complicated geometries and hot carrier effects. With respect to the MC method, the CA exhibits a speed up of two orders of magnitude on scalar processors, coupled to a much more straightforward implementation on parallel processors. © 1993 Editions Frontieres.

Files and links (1)

url

http://ieeexplore.ieee.org/abstract/document/5435455/View

Details

Title: Can cellular automata methods compete with Monte Carlo semiconductor device simulations?
Creators: G Zandler
A Rein
M Saraniti
P Vogl
Paolo Lugli
Publication Details: Proceedings of the 23rd European Solid State Device Research Conference: Grenoble, France, 13 - 16 September 1993, pp.21-28
ISBN: 2-86332-135-8
Conference: 23rd European Solid State Device Research Conference, ESSDERC 1993 (Grenoble, 13/09/1993 - 16/09/1993)
Publisher: IEEE
Identifiers: 2-86332-135-8
(UNIBZ)22680349
991005773541101241
Web of Science ID: A1993BB18A00003
Scopus ID: 2-s2.0-84907703859
Academic Unit: Faculty of Science and Technology
Language: English
Resource Type: Conference proceeding
Author Names String: Zandler G, Rein A, Saraniti M, Vogl P, Lugli P

Metrics

37 Record Views